Ga. Tech scientists lead chemistry lecture, lab session 

             Research scientists from the Georgia Institute of Technology, David Gottfried (far right) and Joel Pikarsky (second from right), led a lecture and lab session recently at Georgia Southwestern State University discussing the use of atomic force microscopy (AFM). In the image above Pikarsky is performing a demonstration with an atomic force microscope for a physical chemistry class taught by Nellie Iordanova (third from right) . AFM is a form of scanning probe microscopy (SPM) where a small probe is scanned across the sample to obtain information about the sample’s surface.

- GSW -